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Microscopy


Atomic Force Microscopy (AFM)


Atomic Force Microscopy (AFM) is an analytical tool used to measure differences in modulus and height of materials in the nanoscale size range. AFM is used on relatively flat surfaces. The primary uses are to characterize either nano-phase morphology or surface roughness. It is also an excellent tool for the analysis of the phase morphology of microphase separated block copolymer systems or other nanoscale products.

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