Atomic Force Microscopy (AFM) :: Polymer Solutions Incorporated - Providing Quality Answers Through Independent Chemical Analysis, Physical Testing, and Research & Development.

Atomic Force Microscopy (AFM)

Atomic Force Microscopy (AFM) is an analytical tool used to measure differences in modulus and height of materials in the nanoscale size range. AFM is used on relatively flat surfaces. The primary uses are to characterize either nano-phase morphology or surface roughness. It is also an excellent tool for the analysis of the phase morphology of microphase separated block copolymer systems or other nanoscale products.

Applications:

Surface roughness
Phase separation
Surface aging studies
Nano-particle dispersion

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Work We've Done

Laminated Films

The surface roughness of a series of laminated film samples was measured and compared. This data helped a client identify critical differences in their film construction processes leading to a consistently improved product to provide to their customers.

Microscopy

Atomic Force Microscopy (AFM)

Applications:

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Work We've Done

Laminated Films The surface roughness of a series of laminated film samples was measured and compared. This data helped a client identify critical differences in their film construction processes leading to a consistently improved product to provide to their customers.

Laminated Films

The surface roughness of a series of laminated film samples was measured and compared. This data helped a client identify critical differences in their film construction processes leading to a consistently improved product to provide to their customers.