Dilute Solution Viscosity Extractions & Digestions

Physical Testing

Thermal Analysis

Gas Chromatography Gas Chromatography / Mass Spectrometry (GC/MS) Headspace Gas Chromatography / Mass Spectrometry (Headspace GC/MS) High-Performance Liquid Chromatography (HPLC) Size Exclusion Chromatography (SEC) / Gel Permeation Chromatography (GPC)

Chemical and Thermal Digestion Solvent Extractions

Atomic Force Microscopy (AFM) Image Analysis Optical Birefringence Optical Microscopy Scanning Electron Microscopy / Energy Dispersive Xray Spectroscopy (SEM/EDS) Transmission Electron Microscopy (TEM)

Compression Custom Fixture Development Durometer Flex (3 & 4 Point Bend) Melt Flow Index (MFI) Specific Gravity & Density Determination Tensile (Film, Plastic, Rubber)

Auger Electron Spectroscopy (AES) Fourier Transform Infrared Spectroscopy (FTIR) Inductively Coupled Plasma (ICP) Analysis Nuclear Magnetic Resonance Spectroscopy (NMR) X-ray Photoelectron Spectroscopy (XPS)

Differential Scanning Calorimetry (DSC) Dynamic Mechanical Analysis (DMA) Rheology Thermogravimetric Analysis (TGA)

Karl Fischer Halide Analysis Potentiometric

Additives Analysis Aging & Chemical Resistance Testing Comparative Analysis Compounded Polymer Analysis Contamination Analysis Custom Method Development & Testing Deformulation & Competitor Product Analysis Depth Profiling and Surface Analysis Extractables & Leachables Analysis Failure Analysis Imported Goods Testing Inductively Coupled Plasma (ICP) Analysis Material Certification & Qualification Medical Product Testing Molecular Weight Analysis Phthalates Analysis Polymer Structure Analysis Quality Control Assurance Routine Testing Services

Expertise Litigation Support

Additives Analysis Counterfeit Plastic Failure Analysis Defect Identification Stolen Formulations

Automotive Consumer Product Testing Litigation Support Medical Devices Packaging Pharmaceutical Plastics, Polymers, Rubber

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Spectroscopy image

Spectroscopy

Auger Electron Spectroscopy (AES)

Auger electron spectroscopy is a widely used surface analysis technique that has been successfully applied to many diverse fields.

It is an excellent tool for performing surface analysis and for determining elemental composition as a function of depth. It has been shown to be particularly useful for analyzing multilayer nanostructure compositions of films, wires, and other microelectronics components.

Applications:

Metallized films

Metal coatings

Surface oxidation

Metal composition as a function of depth

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Work We've Done

Metallized coating analysis

A client wanted to know the composition of a metallized film deposited on a polymeric substrate.

When there are more than one layer of a metallized film Auger electron spectroscopy (AES) may be used in conjunction with XPS or independently. For another client XPS was used in conjunction with AES to determine the number of layers and the chemical composition of each layer. AES allows for depth profiling while monitoring elemental composition. AES has been used for detecting metallized coatings up to 50 layers thick, as well as the elemental composition of each layer.

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