Atomic Force Microscopy (AFM)
AFM is an analytical tool used to measure differences in modulus and height of materials in the nanoscale size range.
The primary uses of Atomic Force Microscopy are to characterize either nano-phase morphology or surface roughness. It is also an excellent tool for the analysis of the phase morphology of microphase separated block copolymer systems or other nanoscale products.
Many samples require a customized approach to adapt to the AFM method. Our scientists have the experience and educational background to develop an appropriate approach to ensure reliable results.
The sample must be immobilized on a flat substrate. Because the maximum scan height is about 10 µm the sample must also be quite flat within the region that is to be scanned.
Samples are typically only about 1 cm by 1 cm in area and 5 mm or less in thickness.
Contact us to discuss your specific sample considerations and testing needs.
Work we've done: