Custom Polymer Synthesis Dilute Solution Viscosity Extractions & Digestions

Physical Testing

Thermal Analysis

Gas Chromatography Gas Chromatography / Mass Spectrometry (GC/MS) Headspace Gas Chromatography / Mass Spectrometry (Headspace GC/MS) High-Performance Liquid Chromatography (HPLC) Size Exclusion Chromatography (SEC) / Gel Permeation Chromatography (GPC)

Chemical and Thermal Digestion Solvent Extractions

Atomic Force Microscopy (AFM) Image Analysis Optical Birefringence Optical Microscopy Scanning Electron Microscopy / Energy Dispersive Xray Spectroscopy (SEM/EDS) Transmission Electron Microscopy (TEM)

Compression Custom Fixture Development Durometer Flex (3 & 4 Point Bend) Melt Flow Index (MFI) Specific Gravity & Density Determination Tensile (Film, Plastic, Rubber)

Auger Electron Spectroscopy (AES) Fourier Transform Infrared Spectroscopy (FTIR) Inductively Coupled Plasma (ICP) Analysis Nuclear Magnetic Resonance Spectroscopy (NMR) X-ray Photoelectron Spectroscopy (XPS)

Differential Scanning Calorimetry (DSC) Dynamic Mechanical Analysis (DMA) Rheology Thermogravimetric Analysis (TGA)

Karl Fischer Halide Analysis Potentiometric

Additives Analysis Aging & Chemical Resistance Testing Comparative Analysis Compounded Polymer Analysis Contamination Analysis Custom Method Development & Testing Deformulation & Competitor Product Analysis Depth Profiling and Surface Analysis Extractables & Leachables Analysis Failure Analysis Imported Goods Testing Inductively Coupled Plasma (ICP) Analysis Material Certification & Qualification Medical Product Testing Molecular Weight Analysis Phthalates Analysis Polymer Structure Analysis Quality Control Assurance Research & Development Routine Testing Services

Expertise Litigation Support

Additives Analysis Counterfeit Plastic Defect Identification Stolen Formulations

Automotive Consumer Product Testing Litigation Support Medical Devices Packaging Pharmaceutical Plastics, Polymers, Rubber

Scanning Electron Microscopy (SEM) micrograph

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Scanning Electron Microscopy (SEM) micrograph and Fourier Transform Infrared Spectroscopy (FTIR) spectrum

Contamination Analysis

The presence of fissures, voids and inclusions may alter the aesthetic and functional performance of products. It is critical that these contaminants be isolated and identified quickly, so that sources can be traced and corrective actions implemented.

How can we help?

We have over 165 years of combined polymer science experience dedicated to solving your problem. We can analyze the contamination of:

Plastic parts

Optical films

Molded products

Adhesives

Substrates

Formulated compositions

Other manufactured products

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Work We've Done

Plastic Mold Inclusions

Organic inclusions as small as 0.005" can be identified using Fourier Transform Infrared Spectroscopy (FTIR). In a recent case, we used spectroscopy to obtain a speck of plastic that was in a molded sample. A difference in chemical composition between the defect and the neighboring matrix material was obvious from the spectra. By comparing the mold spectra against a reference spectra and then the defect spectra against a reference spectra, we were able to determine that the defect was for a polycarbonate.

Extruded Vinyl Inclusions

Inorganic inclusions, 0.0005" or even smaller, can be identified using Scanning Electron Microscopy (SEM) coupled with Energy Dispersive X-ray Spectroscopy (EDS). Recently, we helped identify an inclusion in an extruded vinyl product. The defect was only about 0.0001 inches in diameter. Using Spectroscopy, we determined that the particulate contaminant was composed primarily of silica, calcium and magnesium. This information allowed the plastics producer to identify the specific raw material that was responsible for the contamination.

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