Dilute Solution Viscosity Extractions & Digestions

Physical Testing

Thermal Analysis

Gas Chromatography Gas Chromatography / Mass Spectrometry (GC/MS) Headspace Gas Chromatography / Mass Spectrometry (Headspace GC/MS) High-Performance Liquid Chromatography (HPLC) Size Exclusion Chromatography (SEC) / Gel Permeation Chromatography (GPC)

Chemical and Thermal Digestion Solvent Extractions

Atomic Force Microscopy (AFM) Image Analysis Optical Birefringence Optical Microscopy Scanning Electron Microscopy / Energy Dispersive Xray Spectroscopy (SEM/EDS) Transmission Electron Microscopy (TEM)

Compression Custom Fixture Development Durometer Flex (3 & 4 Point Bend) Melt Flow Index (MFI) Specific Gravity & Density Determination Tensile (Film, Plastic, Rubber)

Auger Electron Spectroscopy (AES) Fourier Transform Infrared Spectroscopy (FTIR) Inductively Coupled Plasma (ICP) Analysis Nuclear Magnetic Resonance Spectroscopy (NMR) X-ray Photoelectron Spectroscopy (XPS)

Differential Scanning Calorimetry (DSC) Dynamic Mechanical Analysis (DMA) Rheology Thermogravimetric Analysis (TGA)

Karl Fischer Halide Analysis Potentiometric

Additives Analysis Aging & Chemical Resistance Testing Comparative Analysis Compounded Polymer Analysis Contamination Analysis Custom Method Development & Testing Deformulation & Competitor Product Analysis Depth Profiling and Surface Analysis Extractables & Leachables Analysis Failure Analysis Imported Goods Testing Inductively Coupled Plasma (ICP) Analysis Material Certification & Qualification Medical Product Testing Molecular Weight Analysis Phthalates Analysis Polymer Structure Analysis Quality Control Assurance Routine Testing Services

Expertise Litigation Support

Additives Analysis Counterfeit Plastic Failure Analysis Defect Identification Stolen Formulations

Automotive Consumer Product Testing Litigation Support Medical Devices Packaging Pharmaceutical Plastics, Polymers, Rubber

Scanning Electron Microscopy (SEM) micrograph

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Scanning Electron Microscopy (SEM) micrograph and Fourier Transform Infrared Spectroscopy (FTIR) spectrum

Contamination Analysis

The presence of fissures, voids and inclusions may alter the aesthetic andfunctional performance of products. It is critical that thesecontaminants be isolated and identified quickly, so that sources can betraced and corrective actions implemented.

How can we help?

We have over 165 years of combined polymer science experience dedicated to solving your problem. We can analyze the contamination of:

Plastic parts

Optical films

Molded products

Adhesives

Substrates

Formulated compositions

Other manufactured products

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Work We've Done

Plastic Mold Inclusions

Organicinclusions as small as 0.005" can be identified using Fourier TransformInfrared Spectroscopy (FTIR). In a recent case, we used spectroscopy to obtaina speck of plastic that was in a molded sample. A difference inchemical composition between the defect and the neighboring matrixmaterial was obvious from the spectra. By comparing the mold spectraagainst a reference spectra and then the defect spectra against areference spectra, we were able to determine that the defect was for apolycarbonate.

Extruded Vinyl Inclusions

Inorganic inclusions, 0.0005" or evensmaller, can be identified using Scanning Electron Microscopy (SEM) coupledwith Energy Dispersive X-ray Spectroscopy (EDS). Recently, we helped identify aninclusion in an extruded vinyl product. The defect was only about0.0001 inches in diameter. Using Spectroscopy, we determined that theparticulate contaminant was composed primarily of silica, calcium andmagnesium. This information allowed the plastics producer to identifythe specific raw material that was responsible for the contamination.

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