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Scanning Electron Microscopy/Energy Dispersive Spectroscopy (SEM/EDS) image

Microscopy


Scanning Electron Microscopy/Energy Dispersive X-ray Spectroscopy (SEM/EDS)


High resolution micrographs of the morphology or topography of a specimen, with great depth of field at very low or very high magnifications, can be obtained.

Applications:


  • Failure analysis
  • Weave patterns
  • Fiber diameter measurements
  • Deformulation projects
  • Elemental compositions
  • Competitive product analysis


Work We've Done


Failure Analysis (Contamination Analysis)


Polymer Compound Analysis:


Competitor Product Analysis