About Atomic Force Microscopy

The primary uses of Atomic Force Microscopy are to characterize either nano-phase morphology or surface roughness.  It is also an excellent tool for the analysis of the phase morphology of microphase separated block copolymer systems or other nanoscale products.

  • Approaches

    Many samples require a customized approach to adapt to the AFM method.  Our scientists have the experience and educational background to develop an appropriate approach to ensure reliable results.

  • Sample Considerations

    The sample must be immobilized on a flat substrate.  Because the maximum scan height is about 10 µm the sample must also be quite flat within the region that is to be scanned. 

    Samples are typically only about 1 cm by 1 cm in area and 5 mm or less in thickness. 

    Contact us to discuss your specific sample considerations and testing needs.

  • Experience

    Work we've done:

    • Surface roughness
    • Phase separation
    • Surface aging studies
    • Nano-particle dispersion