Microscopy

Microscopy

Our microscopy services include optical, electron, and scanning probe microscopy. 

Modern microscopy allows us to obtain images from objects that cannot be seen with the unaided eye. The three main branches of microscopy analysis are optical, electron, and scanning probe microscopy. High-resolution microscopy testing is widely used in material science, polymer composites, particulate analysis, nanotechnology, and semiconductor research.

Products We Test

• Nanomaterials
• Textiles
• Films
• Coatings
• Molded Parts
• And many other materials

Microscopy Methods & Approaches

Optical Microscopy (OM) uses visible light to magnify a sample area 10-2,500x. This microscopy analysis technique often is the first one to be used before additional microscopy testing.

Transmission Electron Microscopy (TEM) uses an electron beam passing through a very thin slice of the specimen, and contrast is generated from differences in electron densities.  Staining may be used to increase contrast.  The method is useful for examining polymers and biological structures with nanometer resolution.

Scanning Electron Microscopy (SEM) scans the surface of the sample with a highly focused electron beam to obtain a surface image. SEM can be coupled with Energy Dispersive Spectroscopy (EDS) for determination of the elemental composition of the sample.

Atomic Force Microscopy (AFM) uses a mechanical cantilever with a sharp tip to scan a flat specimen surface with highest resolution down to a fraction of a nanometer. It can work in ambient conditions.

Optical Birefringence is used to assess existing mechanical stress in transparent materials. The sample is examined in a nondestructive way between cross-polarizing filters.

Image Analysis allows our scientists to extract meaningful information, such as size and geometry of morphological characteristics, from the microscopic images.

Microscopy Applications & Experience